Figure 2-17. Resistance Variations as Function of Potential Probe Position in Fall-of-Potential Method (2-12)

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Grounding, Bonding, and Shielding for Electronic Equipments and Facilities

Extensive Electrode Subsystems (2-13)

MIL-HDBK-419A

Figure 2-17. Resistance Variations as Function of Potential Probe Position in Fall-of-Potential Method (2-12)

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